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Characterization and Metrology
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X-Ray and Ion-Beam Instruments
X-Ray and Ion-Beam Instruments
10 items under this folder.
Nov 02, 2026
Atom Probe Tomography (APT)
Nov 02, 2026
Auger Electron Spectrometer (AES)
Nov 02, 2026
Critical-Dimension Small-Angle X-Ray Scattering (CD-SAXS)
Nov 02, 2026
Rutherford Backscattering Spectrometer (RBS)
Nov 02, 2026
Secondary Ion Mass Spectrometer (SIMS and ToF-SIMS)
Nov 02, 2026
X-Ray Diffractometer (XRD and HRXRD)
Nov 02, 2026
X-Ray Fluorescence Spectrometer (XRF and TXRF)
Nov 02, 2026
X-Ray Photoelectron Spectrometer (XPS)
Nov 02, 2026
X-Ray Reflectometer (XRR)
Nov 02, 2026
X-Ray Topography